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Volumn 151, Issue 2, 2006, Pages 105-120

Methods in carbon K-edge NEXAFS: Experiment and analysis

Author keywords

Analysis; Background subtraction; Carbon; Energy calibration; NEXAFS; Normalisation; Synchrotron radiation

Indexed keywords

CALIBRATION; CARBON; CHEMICAL ANALYSIS; LIGHT SOURCES; SYNCHROTRON RADIATION; ULTRATHIN FILMS;

EID: 33244482438     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2005.11.006     Document Type: Article
Times cited : (151)

References (26)
  • 12
    • 0003828439 scopus 로고
    • D. Briggs, M. P. Seah (Eds.) Wiley
    • D. Briggs, M. P. Seah (Eds.), Practical Surface Analysis, 2nd ed., vol. 1, Wiley, 1990.
    • (1990) Practical Surface Analysis, 2nd Ed. , vol.1
  • 24
    • 33244491324 scopus 로고    scopus 로고
    • Updated tables from (23) are also available from the internet. http://www.cxro.lbl.gov.
  • 25
    • 33244491559 scopus 로고    scopus 로고
    • note
    • In principle, the reference sample does not need to be the same as the substrate. The only requirement of the reference sample is that its photo-absorption spectrum can be easily modelled by an appropriate photo-absorption coefficient and implicitly, must not contain any of the target element as that would place a step edge in the spectral range of interest.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.