A bulk knife-edged as-deposition self-patterning structure for greek-cross and organic thin film transistors

IEEE International Conference on Microelectronic Test Structures

Volumn 2006, Issue , 2006, Pages 149-154

  Harada, Tomoyuki ^a   Ito, Kota ^a   Shibata, Tadashi ^a   Mita, Yoshio ^a  

^a UNIVERSITY OF TOKYO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

HEAT-CYCLES; KNIFE-EDGE STRUCTURES; PENTACENES; SELF-PATTERNING STRUCTURES;

DEGRADATION; DEPOSITION; ELECTRONIC STRUCTURE; ERROR ANALYSIS; EXTRAPOLATION; LITHOGRAPHY; SELF ASSEMBLY; SILICON;

THIN FILM TRANSISTORS;

EID: 33749514462     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICMTS.2006.1614293     Document Type: Conference Paper

References (8)

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