-1/+0.8°C error, accurate temperature sensor using 90nm IV CMOS for on-line thermal monitoring of VLSI circuits

IEEE International Conference on Microelectronic Test Structures

Volumn 2006, Issue , 2006, Pages 9-12

  Sasaki, Masahiro ^a   Ikeda, Makoto ^a   Asada, Kunihiro ^a  

^a UNIVERSITY OF TOKYO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

POWER CONSUMPTION; TEMPERATURE ERROR; THERMAL MONITORING; THERMAL TESTING;

CALIBRATION; ERROR ANALYSIS; MONITORING; SENSORS; TRANSISTORS; VLSI CIRCUITS; VOLTAGE MEASUREMENT;

CMOS INTEGRATED CIRCUITS;

EID: 33749509956     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICMTS.2006.1614264     Document Type: Conference Paper

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