A CMOS smart temperature sensor with a 3σ inaccuracy of ±0.5 °C from -50 °C to 120 °C

IEEE Journal of Solid-State Circuits

Volumn 40, Issue 2, 2005, Pages 454-461

  Pertijs, Michiel A P ^a   Niederkorn, Andrea ^b   Ma, Xu ^c   McKillop, Bill ^d   Bakker, Anton ^e   Huijsing, Johan H ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b Zoran Corporation   (United States)

^c MICROCHIP TECHNOLOGY INC   (United States)

^d Semiconductor   (United States)

^e ANALOG DEVICES INC   (United States)

Author keywords

Calibration; Curvature correction; Dynamic offset cancellation; Smart sensors; Temperature sensors

Indexed keywords

ANALOG TO DIGITAL CONVERSION; BIPOLAR TRANSISTORS; CALIBRATION; CMOS INTEGRATED CIRCUITS; CURRENT DENSITY; ELECTRONICS PACKAGING; INTERFACES (COMPUTER); TEMPERATURE DISTRIBUTION; TRANSISTORS; VOLTAGE CONTROL;

CURVATURE CORRECTION; DYNAMIC OFFSET CANCELLATION; SMART SENSORS; TEMPERATURE SENSORS;

SENSORS;

EID: 13444282357     PISSN: 00189200     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSSC.2004.841013     Document Type: Article

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