Out-of-plane micro-ESPI system for measurement of mechanical properties of film materials

Key Engineering Materials

Volumn 321-323 I, Issue , 2006, Pages 116-120

  Kim, Dong Iel ^b   Huh, Yong Hak ^a   Kee, Chang Doo ^b  

^a Korea Research Institute of Standards and Science   (South Korea)

^b Chonnam National University   (South Korea)

Author keywords

Deflection; Film materials; Interferometric fringe pattern; Out of plane ESPI; Strip bending test

Indexed keywords

BENDING (DEFORMATION); DEFLECTION (STRUCTURES); METAL FOIL; MOIRE FRINGES;

FILM MATERIALS; INTERFEROMETRIC FRINGE PATTERNS; STRIP BENDING TESTS;

NANOSTRUCTURED MATERIALS;

EID: 33749455608     PISSN: 10139826     EISSN: 16629795     Source Type: Book Series    
DOI: 10.4028/0-87849-412-x.116     Document Type: Conference Paper

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