Young's modulus of thin films by speckle interferometry

Measurement Science and Technology

Volumn 9, Issue 4, 1998, Pages 676-685

  Read, David T ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SPECKLE INTERFEROMETRY;

COPPER; ELASTIC MODULI; IMAGE ANALYSIS; INTERFEROMETRY; METALLIC FILMS; POLYCRYSTALLINE MATERIALS; SPECKLE; STRAIN; THIN FILMS;

MECHANICAL VARIABLES MEASUREMENT;

EID: 0032050141     PISSN: 09570233     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-0233/9/4/016     Document Type: Article

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