Strain fields around high-energy ion tracks in α-quartz

Journal of Applied Physics

Volumn 100, Issue 6, 2006, Pages

  Follstaedt, D M ^a   Norman, A K ^a   Doyle, B L ^a   McDaniel, F D ^b  

^a SANDIA NATIONAL LABORATORIES   (United States)

^b UNIVERSITY OF NORTH TEXAS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC STOPPING POWERS; HIGH ENERGY IONS; RADIAL STRAIN; RECIPROCAL LATTICE VECTORS;

AMORPHOUS MATERIALS; DIFFRACTION; ION BOMBARDMENT; QUARTZ; TRANSMISSION ELECTRON MICROSCOPY;

HIGH ENERGY PHYSICS;

EID: 33749354655     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2345029     Document Type: Article

References (23)

1. A. Meftah et al., Phys. Rev. B 49, 12457 (1994).
2. T. Mohanty, P. V. Satyam, N. C. Mishra, and D. Kanjilal, Radiat. Meas. 36, 137 (2003).
3. R. L. Fleischer, P. B. Price, and R. M. Walker, J. Appl. Phys. 36, 3645 (1965);
4. R. L. Fleischer, P. B. Price, R. M. Walker, and E. L. Hubbard, Phys. Rev. 156, 353 (1967).
5. F. Seitz, Discuss. Faraday Soc. 5, 915 (1965).
6. E. M. Bringa and R. E. Johnson, Phys. Rev. Lett. 86, 165501 (2002).
7. M.-D. Hou, S. Klaumtinzer, and G. Schumacher, Phys. Rev. B 41, 1144 (1990).
8. A. Benyagoub, S. Löffler, M. Rammensee, S. Klaumünzer, and G. Saemann-Ischenko, Nucl. Instrum. Methods Phys. Res. B 65, 228 (1992).
9. T. van Dillen, A. Polman, C. M. van Kats, and A. van Blaaderen, Appl. Phys. Lett. 83, 4315 (2003).
10. H. Trinkaus, Nucl. Instrum. Methods Phys. Res. B 146, 204 (1998).
11. H. Trinkaus and A. I. Ryazanov, Phys. Rev. Lett. 74, 5072 (1995).
12. T. van Dillen, A. Polman, P. R. Onck, and E. van der Giessen, Phys. Rev. B 71, 024103 (2005). Figure 2 of this reference shows the predicted radial strain profile, which scales in proportion to the thermal spike temperature rise and to the coefficient of thermal expansion.
13. D. M. Follstaedt, A. K. Norman, P. Rossi, B. L. Doyle, F. D. McDaniel, and E. M. Bringa, Proceedings of the International Conference on Ion Beam Modification of Materials, 2004
14. [Nucl. Instram. Methods Phys. Res. B 242, 79 (2006)].
15. J. F. Ziegler, J. P. Biersack, and U. Littmark, in The Stopping and Range of Ions in Solids, The Stopping and Ranges of Ions in Matter Vol. 1, edited by J. F. Ziegler (Pergamon, New York, 1985).
16. A. Kamarou, E. Wendler, and W. Wesch, J. Appl. Phys. 97, 123532 (2005).
17. http://www.sawyerresearch.com/Qtz_MSDS.htm
18. M. P. Moran, A. K. Norman, and D. M. Follstaedt, Microsc. Microanal. 9, 106 (2003).
19. P. Hirsch, A. Howie, R. B. Nicholson, D. W. Pashley, and M. J. Whelan, Electron Microscopy of Thin Crystals (Robert E. Krieger, Huntington, NY, 1977), Chap. 7, pp. 156 and 159; Chap. 8, p. 195; Chap. 9, p. 208.
20. D. B. Williams and C. B. Carter, Transmission Electron Microscopy (Plenum, New York, 1996), Chap. 4, p. 61; Chap. 12, p. 196; Chap. 13, p. 206; Chap. 23, p. 372; Chap. 25, pp. 403 and 418.
21. M. R. Pascucci, J. L. Hutchison, and L. W. Hobbs, Radiat. Eff. 74, 219 (1983).
22. M. H. Loretto and R. E. Smallman, Defect Analysis in Electron Microscopy (Chapman and Hall, London, 1975), p. 57.
23. http://www.ieee-uffc.org/freqcontrol/quaitz/fc_conqtz2.html