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Volumn 2005, Issue , 2005, Pages 295-298

Low noise and high gain RF MOSFETs on plastic substrates

Author keywords

Associated gain; MOSFET; Plastic; RF Noise

Indexed keywords

ASSOCIATED GAINS; FREQUENCY RANGES; RF NOISE;

EID: 33749258942     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MWSYM.2005.1516584     Document Type: Conference Paper
Times cited : (3)

References (15)
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    • June
    • Y. H. Wu, A. Chin, K. H. Shih, C. C. Wu, S. C. Pai, C. C. Chi, and C. P. Liao, "RF loss and cross talk on extremely high resistivity (10K-lM̄-cm) Si fabricated by ion implantation," IEEE MTT-S Int. Microwave Symp. Dig., vol. 1, pp. 221-224, June 2000.
    • (2000) IEEE MTT-S Int. Microwave Symp. Dig. , vol.1 , pp. 221-224
    • Wu, Y.H.1    Chin, A.2    Shih, K.H.3    Wu, C.C.4    Pai, S.C.5    Chi, C.C.6    Liao, C.P.7
  • 10
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    • Low loss micromachined elliptic filters for millimeter wave telecommunication systems
    • June
    • P. Blondy, A.R. Brown, D. Cros, G. M. Rebeiz, "Low loss micromachined elliptic filters for millimeter wave telecommunication systems," IEEE MTT-S Int. Microwave Symp., pp. 1181-1184, June 1998.
    • (1998) IEEE MTT-S Int. Microwave Symp. , pp. 1181-1184
    • Blondy, P.1    Brown, A.R.2    Cros, D.3    Rebeiz, G.M.4
  • 12
    • 0043095381 scopus 로고    scopus 로고
    • Performance comparison of 5GHz VCOs integrated by CMOS compatible high Q MEMS inductors
    • June
    • E.-C. Park, S.-H. Baek, T.-S. Song, J.-B. Yoon, and E. Yoon, "Performance Comparison of 5GHz VCOs Integrated by CMOS Compatible High Q MEMS Inductors," IEEE MTT-S Int. Microwave Symp., pp. 721-724, June 2003.
    • (2003) IEEE MTT-S Int. Microwave Symp. , pp. 721-724
    • Park, E.-C.1    Baek, S.-H.2    Song, T.-S.3    Yoon, J.-B.4    Yoon, E.5
  • 13
    • 4444250838 scopus 로고    scopus 로고
    • Modeling finger number dependence on RF noise to 10 GHz in 0.13 μm node MOSFETs with 80nm gate length
    • June
    • M.C. King, Z. M. Lai, C. H. Huang, C. F. Lee, M. W. Ma, C. M. Huang, Y. Chang and Albert Chin, "Modeling finger number dependence on RF noise to 10 GHz in 0.13 μm node MOSFETs with 80nm gate length," IEEE RF IC Symp. Dig., pp. 171-174, June 2004.
    • (2004) IEEE RF IC Symp. Dig. , pp. 171-174
    • King, M.C.1    Lai, Z.M.2    Huang, C.H.3    Lee, C.F.4    Ma, M.W.5    Huang, C.M.6    Chang, Y.7    Chin, A.8


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.