Thermal boundary conductance response to a change in Cr/Si interfacial properties

Applied Physics Letters

Volumn 89, Issue 13, 2006, Pages

  Hopkins, Patrick E ^a   Norris, Pamela M ^a  

^a University of Virginia   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BOUNDARY CONDUCTANCE; INTERFACIAL PROPERTIES; INTERFACIAL TRANSPORTS; THERMAL DISSIPATIONS;

AUGER ELECTRON SPECTROSCOPY; CHROMIUM; ENERGY DISSIPATION; INTERFACES (MATERIALS); MICROELECTRONICS; SILICON; THERMAL CONDUCTIVITY;

SURFACE PROPERTIES;

EID: 33749238668     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2357585     Document Type: Article

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