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Volumn 2005, Issue , 2005, Pages 923-926

W-Band RF MEMS double and triple-stub impedance tuners

Author keywords

Impedance tuner; Load pull; Matching network; Noise Parameter; On wafer; RF MEMS

Indexed keywords

CAPACITORS; ELECTRIC IMPEDANCE; NATURAL FREQUENCIES; TUNERS; WIRELESS TELECOMMUNICATION SYSTEMS;

EID: 33749237354     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MWSYM.2005.1516774     Document Type: Conference Paper
Times cited : (33)

References (8)
  • 1
    • 0037718464 scopus 로고    scopus 로고
    • A wideband automated measurement system for on-wafer noise parameter measurements at 50-75 GHz
    • June
    • M. Kantanen, M. Lahdes, T. Vähä-Heikkilä, J. Tuovinen, "A wideband automated measurement system for on-wafer noise parameter measurements at 50-75 GHz", IEEE Trans. on Microwave Theory & Tech., vol. 51, pp. 1489-1495, June 2003.
    • (2003) IEEE Trans. on Microwave Theory & Tech. , vol.51 , pp. 1489-1495
    • Kantanen, M.1    Lahdes, M.2    Vähä-Heikkilä, T.3    Tuovinen, J.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.