Electronic properties of clean unreconstructed 6H-SiC(0 0 0 1) surfaces studied by angle resolved photoelectron spectroscopy

Surface Science

Volumn 600, Issue 18, 2006, Pages 3845-3850

  Emtsev, K V ^a   Seyller, Th ^a   Ley, L ^a   Tadich, A ^b   Broekman, L ^b   Riley, J D ^b   Leckey, R C G ^b   Preuss, M ^c  

^a UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

^b LA TROBE UNIVERSITY   (Australia)

^c FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

Author keywords

Electronic structure; Mott Hubbard metal insulator transition; Photoelectron spectroscopy; Photon induced desorption; Silicon carbide

Indexed keywords

DISPERSIONS; ELECTRONIC PROPERTIES; METAL INSULATOR TRANSITION; PHOTOELECTRON SPECTROSCOPY; SURFACE PROPERTIES; SYNCHROTRON RADIATION;

MOTT HUBBARD METAL INSULATOR TRANSITION; PHOTON INDUCED DESORPTION; SURFACE BANDS; VALENCE BAND;

SILICON CARBIDE;

EID: 33749151147     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2006.01.094     Document Type: Article

References (16)

1. Starke U. In: Choyke W.J., Matsunami H., and Pensl G. (Eds). Silicon Carbide Recent Major Advances (2004), Springer 281
2. Northrup J., and Neugebauer J. Phys. Rev. B 52 (1995) R17001
3. Sabisch M., Krüger P., and Pollmann J. Phys. Rev. B 55 (1997) 10561
4. Bechstedt F., and Furthmüller J. J. Phys.: Condens. Matter 16 (2004) S1721
5. Johansson L.I., Owman F., and Martensson P. Surf. Sci. 360 (1996) L478
6. Furthmüller J., Bechstedt F., Hüsken H., Schröter B., and Richter W. Phys. Rev. B 58 (1998) 13712
7. Themlin J.-M., Forbeaux I., Langlais V., Belkhir H., and Deveber J.-M. Europhys. Lett. 39 (1997) 61
8. Benesch C., Fartmann M., and Merz H. Phys.Rev. B 64 (2001) 205314
9. Hollering M., Maier F., Sieber N., Stammler M., Ristein J., Ley L., Stampfl A.P.J., Riley J.D., Leckey R.C.G., Leisenberger F.P., and Netzer F.P. Surf. Sci. 442 (1999) 531
10. Lu W., Krüger P., and Pollmann J. Phys. Rev. B 61 (2000) 13737
11. M. Preuss, F. Bechstedt, unpublished.
12. Seyller Th. J. Phys.: Condens. Matter 16 (2004) S1755
13. Sieber N., Seyller Th., Ley L., Polcik M., James D., Riley J.D., and Leckey R.C.G. Mater. Sci. Forum 389-393 (2003) 713
14. Broekman L., Tadich A., Huwald E., Riley J., Leckey R., Seyller Th., Emtsev K., and Ley L. J. Electr. Spectr. Relat. Phenom. 144-147 (2005) 1001
15. Nicholls J.M., Martensson P., Hansson G.V., and Northrup J.E. Phys. Rev. B 32 (1985) 1333
16. Emtsev K.V., Seyller Th., Ley L., Tadich A., Broekman L., Riley J.D., Leckey R.C.G., and Preuss M. Phys. Rev. B 73 (2006) 075412