Non-destructive investigation of composition, chemical properties and structure of materials by synchrotron radiation

Insight: Non-Destructive Testing and Condition Monitoring

Volumn 48, Issue 9, 2006, Pages 540-544

  Görner, Wolf ^a   Eichelbaum, Maik ^b   Matschat, Ralf ^a   Rademann, Klaus ^b   Radtke, Martin ^a   Reinholz, Uwe ^a   Riesemeier, Heinrich ^a  

^a BAM FEDERAL INSTITUTE FOR MATERIALS RESEARCH AND TESTING   (Germany)

^b HUMBOLDT UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION; ENERGY DISPERSIVE SPECTROSCOPY; NONDESTRUCTIVE EXAMINATION; REFLECTOMETERS;

ENERGY DISPERSIVE X-RAY FLUORESCENCE; THIN SURFACE LAYERS;

SYNCHROTRON RADIATION;

EID: 33749066558     PISSN: 13542575     EISSN: None     Source Type: Journal    
DOI: 10.1784/insi.2006.48.9.540     Document Type: Article

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