Synchrotron radiation refraction topography for characterization of lightweight materials

X-Ray Spectrometry

Volumn 33, Issue 6, 2004, Pages 402-406

  Müller, Bernd R ^a   Hentschel, Manfred P ^a  

^a BAM FEDERAL INSTITUTE FOR MATERIALS RESEARCH AND TESTING   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON FIBER REINFORCED PLASTICS; CARBON FIBERS; CCD CAMERAS; CERAMIC MATERIALS; IMAGE RESOLUTION; INTERFACES (MATERIALS); MATERIALS TESTING; MICROSTRUCTURE; MULTILAYERS; NONDESTRUCTIVE EXAMINATION; PORE SIZE; SINGLE CRYSTALS; SURFACE TOPOGRAPHY; SYNCHROTRONS; TOPOGRAPHY;

ANGULAR RESOLUTION; BEAM INTENSITY; FAST MEASUREMENT; LIGHTWEIGHT MATERIALS; MONOCHROMATIC RADIATION; SMALL ANGLE SCATTERING; SMALL-ANGLE SCATTERING; SPATIAL RESOLUTION; X-RAY REFRACTION; X-RAY SOURCES;

SYNCHROTRON RADIATION;

EID: 9444239143     PISSN: 00498246     EISSN: None     Source Type: Journal    
DOI: 10.1002/xrs.736     Document Type: Conference Paper

References (7)

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