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Volumn 376, Issue 5, 2003, Pages 558-561
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X-ray microscopy: Methods and perspectives
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Author keywords
[No Author keywords available]
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Indexed keywords
CYTOLOGY;
DEHYDRATION;
ELECTROMIGRATION;
FREE ELECTRON LASERS;
HIGH ENERGY PHYSICS;
IMAGING TECHNIQUES;
OPTICAL RESOLVING POWER;
X RAY ANALYSIS;
ARTIFACTS;
MATERIAL SCIENCE;
SEMICONDUCTOR INDUSTRY;
SPATIAL RESOLUTION;
X RAY MICROSCOPES;
COMPUTER ASSISTED TOMOGRAPHY;
ELECTRON PROBE MICROANALYSIS;
INSTRUMENTATION;
MATERIALS TESTING;
METHODOLOGY;
NANOTECHNOLOGY;
REVIEW;
THREE DIMENSIONAL IMAGING;
ELECTRON PROBE MICROANALYSIS;
IMAGING, THREE-DIMENSIONAL;
MATERIALS TESTING;
NANOTECHNOLOGY;
TOMOGRAPHY, X-RAY COMPUTED;
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EID: 0142245541
PISSN: 16182642
EISSN: None
Source Type: Journal
DOI: 10.1007/s00216-003-2007-x Document Type: Review |
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Times cited : (23)
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References (13)
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