Kernel ridge regression for volume fraction prediction in electrical impedance tomography

Measurement Science and Technology

Volumn 17, Issue 10, 2006, Pages 2711-2720

  Goldswain, G ^a   Tapson, J ^a  

^a UNIVERSITY OF CAPE TOWN   (South Africa)

Author keywords

Electrical impedance tomography; Kernel ridge regression; Neural networks

Indexed keywords

MATHEMATICAL MODELS; MEASUREMENT THEORY; MULTILAYER NEURAL NETWORKS; REGRESSION ANALYSIS; VOLUME FRACTION;

KERNEL RIDGE REGRESSION; MEASUREMENT PLANE; RECONSTRUCTION PROBLEMS;

ELECTRIC IMPEDANCE TOMOGRAPHY;

ELECTRIC IMPEDANCE TOMOGRAPHY; MATHEMATICAL MODELS; MEASUREMENT THEORY; MULTILAYER NEURAL NETWORKS; REGRESSION ANALYSIS; VOLUME FRACTION;

EID: 33749039968     PISSN: 09570233     EISSN: 13616501     Source Type: Journal    
DOI: 10.1088/0957-0233/17/10/025     Document Type: Conference Paper

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