Statistical estimation of resistance/conductance by electrical impedance tomography measurements

IEEE Transactions on Medical Imaging

Volumn 23, Issue 7, 2004, Pages 829-838

  Demidenko, Eugene ^a   Hartov, Alex ^b   Paulsen, Keith ^b  

^a Dartmouth College   (United States)

^b DARTMOUTH COLLEGE   (United States)

Author keywords

Electrical impedance; Laplace equation; Least squares; Neumann to Dirichlet map; Statistical test

Indexed keywords

ALGORITHMS; CALIBRATION; ELECTRIC CONDUCTANCE; ELECTRIC RESISTANCE; ELECTRODES; LAPLACE TRANSFORMS; LEAST SQUARES APPROXIMATIONS; MATRIX ALGEBRA; STATISTICAL METHODS; VECTORS;

RESISTANCE MATRIX; SYSTEM ERRORS; UNSTRUCTURED MATRICES;

ELECTRIC IMPEDANCE TOMOGRAPHY;

AGAR;

ARTICLE; ELECTRIC CONDUCTIVITY; ELECTRODE; IMAGE PROCESSING; IMPEDANCE; METHODOLOGY; REGRESSION ANALYSIS; STATISTICAL ANALYSIS; STATISTICAL MODEL; TOMOGRAPHY;

AGAR; DATA INTERPRETATION, STATISTICAL; ELECTRIC CONDUCTIVITY; ELECTRIC IMPEDANCE; ELECTRODES; IMAGE PROCESSING, COMPUTER-ASSISTED; LEAST-SQUARES ANALYSIS; LINEAR MODELS; TOMOGRAPHY;

EID: 3142674985     PISSN: 02780062     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMI.2004.827965     Document Type: Article

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