The focal plane of the Simbol-X space mission

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6276, Issue , 2006, Pages

  Dirks, B P F ^a   Ferrando, P ^a   Briel, U ^d   Gevin, O ^a   Kendziorra, E ^e   Laurent, P ^a   Limousin, O ^a   Lugiez, F ^a   Martignac, J ^a   Authier, M ^a   Chapron, C ^f   Lechner, P ^g   Pareschi, Q ^b   Rio, Y ^a   Roques, J P ^c   Salin, P ^f   Struder L ^d  

^a CEA SACLAY   (France)

^b INAF OSSERVATORIO ASTRONOMICO DI BRERA   (Italy)

^c IRAP   (France)

^d MAX PLANCK INSTITUT FÜR EXTRATERRESTRISCHE PHYSIK   (Germany)

^e UNIVERSITY OF TÜBINGEN   (Germany)

^f UNIVERSITÉ PARIS DIDEROT   (France)

^g PNSENSOR GMBH   (Germany)

Author keywords

Astrophysics; CdTe; DEPFET; Formation flying; IDeF X; Simbol X; X ray optics

Indexed keywords

CDTE; DEPFET; FORMATION FLYING; SIMBOL-X; X-RAY OPTICS;

APPLICATION SPECIFIC INTEGRATED CIRCUITS; ASTROPHYSICS; CADMIUM COMPOUNDS; IMAGE SENSORS; OPTICAL TELESCOPES; SINGLE CRYSTALS; SPACE APPLICATIONS; X RAY OPTICS;

INFRARED DETECTORS;

EID: 33749002975     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.672801     Document Type: Conference Paper

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