Advancements in DEPMOSFET device developments for XEUS

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6276, Issue , 2006, Pages

  Treis, J ^a,f   Bombelli, L ^b   Eckart, R ^d,f   Fiorini, C ^b   Fischer, P ^c   Halker O ^a,f   Herrmann, S ^a,f   Lechner, P ^d,f   Lutz, G ^e,f   Peric, I ^c   Porro, M ^a,f   Richter, R H ^e,f   Schaller, G ^a,f   Schopper, F ^a,f   Soltau, H ^d,f   Struder L ^a,f   Wolfel S ^a,f  

^a MAX PLANCK INSTITUT FÜR EXTRATERRESTRISCHE PHYSIK   (Germany)

^b POLITECNICO DI MILANO   (Italy)

^c UNIVERSITY OF MANNHEIM   (Germany)

^d PNSENSOR GMBH   (Germany)

^e MAX PLANCK INSTITUT FÜR PHYSIK   (Germany)

^f MPI HALBLEITERLABOR   (Germany)

Author keywords

Active Pixel Sensor; Astronomy; DEPFET; Imaging; RNDR; Spectroscopy; X Ray; XEUS

Indexed keywords

ACTIVE PIXEL SENSOR; DEPFET; RNDR; XEUS;

ASTRONOMY; ELECTRONIC EQUIPMENT; IMAGING SYSTEMS; OPTICAL RESOLVING POWER; X RAY SPECTROSCOPY;

IMAGE SENSORS;

EID: 33748988611     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.672029     Document Type: Conference Paper

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