The ISGRI CdTe gamma camera in-flight performance

IEEE Transactions on Nuclear Science

Volumn 52, Issue 6, 2005, Pages 3119-3123

  Lebrun, François ^a,b  

^a UNIVERSITÉ PARIS DIDEROT   (France)

^b UNIVERSITÉ PARIS DIDEROT   (France)

Author keywords

Extraterrestrial measurements; Gamma ray astronomy detectors; Gamma ray spectroscopy detectors; Nuclear imaging; Semiconductor device radiation effects; Semiconductor device reliability; Semiconductor device testing; Semiconductor radiation detectors

Indexed keywords

ASTRONOMY; CHARGED PARTICLES; GAMMA RAYS; IMAGE SENSORS; RADIATION DETECTORS; RADIATION EFFECTS; SEMICONDUCTING CADMIUM TELLURIDE; SEMICONDUCTOR DEVICE TESTING;

NUCLEAR IMAGING; SEMICONDUCTOR RADIATION DETECTORS; SOFT GAMMA-RAY IMAGER (SGRI);

CAMERAS;

EID: 33144480097     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2005.862920     Document Type: Conference Paper

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