Spectroscopic phase modulated ellipsometry in application to some novel single and polycrystalline ternary compounds

Physica Status Solidi (A) Applications and Materials Science

Volumn 203, Issue 11, 2006, Pages 2873-2881

  Mamedov, N ^a   Shim, Y ^b   Toyota, H ^c   Wakita, K ^b   Yamamoto, N ^b   Iida, S ^d  

^a INSTITUTE OF PHYSICS   (Azerbaijan)

^b Osaka Prefecture University   (Japan)

^c NAGAOKA UNIVERSITY OF TECHNOLOGY   (Japan)

^d SHIZUOKA INSTITUTE OF SCIENCE AND TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

OPTICAL CONSTANTS; POLARIZATION DEGREE; SPECTROSCOPIC PHASE MODULATED ELLIPSOMETRY (SPME); TERNARY THIOGALLATE COMPOUNDS;

ANISOTROPY; DIELECTRIC PROPERTIES; LIGHT REFLECTION; PHASE MODULATION; POLYCRYSTALLINE MATERIALS; SPECTROSCOPIC ANALYSIS; SURFACE ROUGHNESS; TERNARY SYSTEMS;

ELLIPSOMETRY;

EID: 33748993396     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.200669656     Document Type: Article

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