Phase-modulated spectroscopic ellipsometry and polarized transmission intensity studies of wide-gap biaxial CaGa2S4

Thin Solid Films

Volumn 455-456, Issue , 2004, Pages 244-247

  Shim, Yonggu ^a   Mamedov, Nazim ^a   Yamamoto, Nobuyuki ^a  

^a Osaka City University   (Japan)

Author keywords

Biaxial materials; CaGa2S4; Dielectric function; Refractive index; Spectroscopic phase modulated ellipsometry

Indexed keywords

ELECTRON TRANSITIONS; ELLIPSOMETRY; LIGHT POLARIZATION; LIGHT TRANSMISSION; PHOTONS; REFRACTIVE INDEX; SPECTROSCOPIC ANALYSIS;

BIAXIAL MATERIALS; CAGA2S4; DIELECTRIC FUNCTIONS; SPECTROSCOPIC PHASE MODULATED ELLIPSOMETRY;

CALCIUM COMPOUNDS;

EID: 17144455797     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2004.01.010     Document Type: Conference Paper

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