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Volumn 14, Issue 19, 2006, Pages 8706-8715

Correction of diffraction effects in confocal Raman microspectroscopy

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVE DIFFRACTION; FOCUSING; FOURIER TRANSFORM INFRARED SPECTROSCOPY; INTEGRAL EQUATIONS; THIN FILMS;

EID: 33748944157     PISSN: 10944087     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.14.008706     Document Type: Article
Times cited : (11)

References (16)
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    • Analysis of thin film coatings on poly(ethylene terephthalate) by confocal raman microscopy and surface-enhanced Raman scattering
    • G. D. McAnally, N. J. Everall, J. M. Chalmers, and W. E. Smith, "Analysis of Thin Film Coatings on Poly(ethylene terephthalate) by Confocal Raman Microscopy and Surface-Enhanced Raman Scattering," Appl. Spectrosc. 57, 44 (2003).
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    • Art. No. 104901
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.