Aberrations in confocal spectroscopy of polymeric materials: Erroneous thicknesses and intensities, and loss of resolution

Journal of Applied Polymer Science

Volumn 81, Issue 7, 2001, Pages 1662-1669

  Michielsen, Stephen ^a  

^a Georgia Institute of Technology   (United States)

Author keywords

Aberrations; Confocal microscopy; LSCM; Polymers; Raman microscopy

Indexed keywords

ABERRATIONS; FLUORESCENCE; OPTICAL MICROSCOPY; RAMAN SPECTROSCOPY; REFRACTION; REFRACTIVE INDEX;

CONFOCAL SPECTROSCOPY; ERRONEOUS LOSSES;

ORGANIC POLYMERS;

EID: 0035882707     PISSN: 00218995     EISSN: None     Source Type: Journal    
DOI: 10.1002/app.1597     Document Type: Article

References (13)