Resonant soft x-ray emission spectroscopy of V2O3, VO2 and NaV2O5

Surface Review and Letters

Volumn 9, Issue 2, 2002, Pages 1369-1374

  Schmitt, T ^a   Duda, L C ^a   Augustsson, A ^a   Guo, J H ^a   Nordgren, J ^a   Downes, J E ^b   Mcguinness, C ^b   Smith, K E ^b   Dhalenne, G ^c   Revcolevschi, A ^c   Klemm, M ^d   Horn, S ^d  

^a UPPSALA UNIVERSITY   (Sweden)

^b Boston University   (United States)

^c UNIVERSITÉ PARIS SUD   (France)

^d UNIVERSITY OF AUGSBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

VANADIUM DERIVATIVE;

ABSORPTION; CONFERENCE PAPER; DENSITY; ENERGY; FLAME PHOTOMETRY; MEDICAL RECORD; NUCLEAR MAGNETIC RESONANCE; RADIATION SCATTERING; ROOM TEMPERATURE; SEMICONDUCTOR; X RAY EMISSION SPECTROSCOPY;

EID: 0036553626     PISSN: 0218625X     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0218625X02003822     Document Type: Conference Paper

References (17)