Domain engineering of epitaxial PbTiO3 thin films by the control of misfit strain

Integrated Ferroelectrics

Volumn 68, Issue , 2004, Pages 237-245

  Lee, Kilho ^a   Kim, Yong Kwan ^a   Baik, Sunggi ^a  

^a Pohang University of Science and Technology (POSTECH)   (South Korea)

Author keywords

Domain engineering; Ferroelectric thin films; Finite element method; Pt electrode thickness

Indexed keywords

DISLOCATIONS (CRYSTALS); EPITAXIAL GROWTH; FINITE ELEMENT METHOD; SINGLE CRYSTALS; STRAIN CONTROL; THICKNESS MEASUREMENT;

DOMAIN ENGINEERING; DOMAIN STRUCTURE; LATTICE MISMATCH; PT ELECTRODE THICKNESS;

FERROELECTRIC THIN FILMS;

EID: 33748865240     PISSN: 10584587     EISSN: 16078489     Source Type: Conference Proceeding    
DOI: 10.1080/10584580490896562     Document Type: Article

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