Twinning in thin films - I. Elastic analysis

Acta Materialia

Volumn 44, Issue 10, 1996, Pages 4085-4096

  Sridhar, N ^a   Rickman, J M ^b   Srolovitz, D J ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

^b Lehigh University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; CRYSTAL MICROSTRUCTURE; ELASTICITY; INTERFACES (MATERIALS); INTERFACIAL ENERGY; STRESS ANALYSIS; SUBSTRATES; THERMAL EXPANSION; THIN FILMS;

ELASTIC ENERGY RELEASE; ELASTIC LINE FORCE DIPOLES;

TWINNING;

EID: 0030270522     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6454(96)00058-4     Document Type: Article

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