Oxidation-induced strengthening in ground silicon carbide

Journal of Materials Science

Volumn 41, Issue 15, 2006, Pages 4978-4980

  Chu, M C ^a   Cho, S J ^a   Sarkar, D ^b   Basu, B ^b   Yoon, G J ^a   Park, H M ^a  

^a Korea Research Institute of Standards and Science   (South Korea)

^b INDIAN INSTITUTE OF TECHNOLOGY KANPUR   (India)

Author keywords

[No Author keywords available]

Indexed keywords

CRACKS; ENERGY DISPERSIVE SPECTROSCOPY; OXIDATION; SCANNING ELECTRON MICROSCOPY; SILICA; STRESSES; X RAY DIFFRACTION;

FIELD-EMISSION SCANNING ELECTRON MICROSCOPY (FESEM); FOUR-POINT BENDING FIXTURES; MICROSTRUCTURAL INVESTIGATION; OXIDATION-INDUCED STRENGTHENING;

SILICON CARBIDE;

EID: 33748850200     PISSN: 00222461     EISSN: 15734803     Source Type: Journal    
DOI: 10.1007/s10853-006-0139-z     Document Type: Article

References (14)

1. Lange JJ, Radford KC (1970) J Am Ceram Soc 53:420
2. Gupta TK (1976) J Am Ceram Soc 59:259
3. Moffatt JE, Plumbridge WJ, Hermann R (1996) Br Ceram Trans 95:23
4. Choi SR, Tikara V (1992) Scripta Metall Mater 26:1263
5. Chu MC, Ando K, Sato S, Yao F, Kobayashi Y (1998) High Pressure Inst Jpn 36:82
6. Zhang YZ, Edwards L, Plumbridge WJ (1998) J Am Ceram Soc 81:1861
7. Yao F, Ando K, Chu MC, Sato S (2000) J Mater Sci Lett 12:1081
8. Chu MC, Sato S, Kobayashi Y, Ando K (1995) Fatigue Fract Eng Mater Struct 18:1019
9. Petrovic JJ, Jacobson LA (1976) J Am Ceram Soc 59:34
10. Korous Y, Chu MC, Nakatani M, Ando K (2000) J Am Cerm Soc 83:2788
11. Chu MC, Cho SJ, Park HM, Yoon KJ, Ryu H (2004) Mater Lett 58:1313
12. Chu MC, Cho SJ, Lee YC, Park HM, Yoon DY (2004) J Am Ceram Soc 87:490
13. ISO 14740 (2000) Fine ceramics - Test method for flexural strength of monolithic ceramics at room temperature
14. Mecholsky JJ, Freiman SW, Rice RW (1977) J Am Ceram Soc 60:114