A novel process for CeO2 single buffer layer on biaxially textured metal substrates in YBCO coated conductors

Superconductor Science and Technology

Volumn 19, Issue 10, 2006, Pages 1068-1072

  Xiong, Jie ^a   Chen, Yin ^a   Qiu, Yang ^a   Tao, Bowan ^a   Qin, Wenfeng ^a   Cui, Xumei ^a   Tang, Jinlong ^a   Li, Yanrong ^a  

^a UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; CERIUM COMPOUNDS; MORPHOLOGY; SPUTTERING; SURFACES; THICKNESS MEASUREMENT; THIN FILMS;

ANNEALING TEMPERATURES; COATED CONDUCTORS; METAL SUBSTRATES; SINGLE BUFFER LAYERS;

SUPERCONDUCTING MATERIALS;

EID: 33748769803     PISSN: 09532048     EISSN: 13616668     Source Type: Journal    
DOI: 10.1088/0953-2048/19/10/014     Document Type: Article

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