Comparative studies on the growth conditions of CeO2 and Y2O3 buffer layers on NiW tapes

Superconductor Science and Technology

Volumn 17, Issue 1, 2004, Pages 148-154

  Lim, S M ^a   Kim, H S ^a   Chung, K C ^a   Lee, B S ^a   Youm, D ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CERIUM COMPOUNDS; FILM GROWTH; SCANNING ELECTRON MICROSCOPY; SPUTTERING; SUPERCONDUCTING TAPES; X RAY DIFFRACTION ANALYSIS; YTTRIUM COMPOUNDS;

CERIUM OXIDE BUFFER LAYERS; NICKEL TUNGSTEN TAPES; YTTRIUM OXIDE BUFFER LAYERS;

SUPERCONDUCTING FILMS;

EID: 0942288929     PISSN: 09532048     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-2048/17/1/026     Document Type: Article

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