Effect of Cu/Al ratio on the properties of CuAlSe2 thin films prepared by co-evaporation

Materials Chemistry and Physics

Volumn 100, Issue 1, 2006, Pages 152-157

  Reddy, Y Bharath Kumar ^a   Raja, V Sundara ^a  

^a SRI VENKATESWARA UNIVERSITY   (India)

Author keywords

Compound semiconductors; Electrical properties; Optical properties; Structural properties

Indexed keywords

ALUMINUM; COPPER; ELECTRIC PROPERTIES; EVAPORATION; OPTICAL PROPERTIES; SELENIUM; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

COMPOUND SEMICONDUCTORS; GLASS SUBSTRATES; STRUCTURAL PROPERTIES;

SEMICONDUCTING FILMS;

EID: 33748747862     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchemphys.2005.12.025     Document Type: Article

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