Optical properties of CuAlX2 (X = Se, Te) thin films obtained by annealing of copper, aluminum and chalcogen layers sequentially deposited

Thin Solid Films

Volumn 371, Issue 1, 2000, Pages 195-200

  El Moctar, C O ^a   Kambas, K ^b   Marsillac, S ^a   Anagnostopoulos, A ^b   Bernede J C ^a   Benchouck, K ^c  

^a Equipes Couches Minces Mat N   (France)

^b ARISTOTLE UNIVERSITY OF THESSALONIKI   (Greece)

^c UNIVERSITY OF ORAN   (Algeria)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER COMPOUNDS; CRYSTALLIZATION; ENERGY GAP; LIGHT EMISSION; LIGHT REFLECTION; OPTICAL VARIABLES MEASUREMENT; SPECTROSCOPIC ANALYSIS; SYNTHESIS (CHEMICAL); THIN FILMS;

REFLECTION SPECTROSCOPY;

SEMICONDUCTING FILMS;

EID: 0033700841     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(00)00985-8     Document Type: Article

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