Optical, structural and electrical properties of co-evaporated CuIn 2Se3.5 thin films

Materials Letters

Volumn 58, Issue 12-13, 2004, Pages 1839-1843

  Reddy, Y Bharath Kumar ^a   Raja, V Sundara ^a  

^a SRI VENKATESWARA UNIVERSITY   (India)

Author keywords

CuIn2Se3.5; Defect chalcopyrites; Optical band gap; Ordered vacancy compound (OVC)

Indexed keywords

ACTIVATION ENERGY; ELECTRIC CONDUCTIVITY; ENERGY GAP; EVAPORATION; GRAIN SIZE AND SHAPE; POLYCRYSTALLINE MATERIALS; SCANNING ELECTRON MICROSCOPY; SELENIUM; SINGLE CRYSTALS; SPECTRUM ANALYSIS; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

CUIN2SE3.5; DEFECT CHALCOPYRITES; OPTICAL BAND GAPS; ORDERED VACANCY COMPOUNDS (OVC);

COPPER COMPOUNDS;

EID: 1642617525     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matlet.2003.11.025     Document Type: Article

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