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Volumn 515, Issue 2 SPEC. ISS., 2006, Pages 421-424
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Dynamic behaviour of the reactive sputtering process
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Author keywords
Magnetron; Process simulation; Reactive sputtering
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Indexed keywords
COMPUTER SIMULATION;
DEPOSITION;
HYSTERESIS;
MAGNETRONS;
PRESSURE MEASUREMENT;
PROCESS SIMULATION;
PROCESSING CURVES;
REACTIVE SPUTTERING;
SPUTTERING;
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EID: 33748743892
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/j.tsf.2005.12.250 Document Type: Article |
Times cited : (76)
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References (8)
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