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Volumn 515, Issue 2 SPEC. ISS., 2006, Pages 421-424

Dynamic behaviour of the reactive sputtering process

Author keywords

Magnetron; Process simulation; Reactive sputtering

Indexed keywords

COMPUTER SIMULATION; DEPOSITION; HYSTERESIS; MAGNETRONS; PRESSURE MEASUREMENT;

EID: 33748743892     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2005.12.250     Document Type: Article
Times cited : (76)

References (8)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.