Silicon nanotubes: Synthesis and characterization

Thin Solid Films

Volumn 508, Issue 1-2, 2006, Pages 226-230

  Castrucci, P ^a   Scarselli, M ^a   De Crescenzi, M ^a   Diociaiuti, M ^b   Chaudhari, Prajakta S ^c   Balasubramanian, C ^c   Bhave, Tejashree M ^c   Bhoraskar, S V ^c  

^a UNIVERSITY OF ROME TOR VERGATA   (Italy)

^b ISTITUTO SUPERIORE DI SANITÀ   (Italy)

^c UNIVERSITY OF PUNE   (India)

Author keywords

Electron energy loss spectroscopy (EELS); Nanostructures; Silicon; Transmission electron microscopy (TEM)

Indexed keywords

CARBON NANOTUBES; CONDENSATION; EDGE DETECTION; NANOSTRUCTURED MATERIALS; SCANNING TUNNELING MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRON ENERGY LOSS NEAR-EDGE STRUCTURE (EELNES); GAS PHASE CONDENSATION; NANOSTRUCTURES;

SILICON;

EID: 33748638845     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2005.07.348     Document Type: Article

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