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Volumn 2005, Issue , 2005, Pages 342-347

Mitigating soft errors in highly associative cache with CAM-based tag

Author keywords

[No Author keywords available]

Indexed keywords

ASSOCIATIVE STORAGE; COMPUTATIONAL METHODS; COMPUTER SYSTEM RECOVERY; COMPUTER SYSTEMS; ERROR DETECTION; PERFORMANCE;

EID: 33748563958     PISSN: 10636404     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICCD.2005.76     Document Type: Conference Paper
Times cited : (20)

References (12)
  • 1
    • 33748541164 scopus 로고    scopus 로고
    • Intel XScale Technology. http://www.intel.com/design/intelxscale.
  • 2
    • 1542690244 scopus 로고    scopus 로고
    • Soft errors in advanced semiconductor devices-part I: Three radiation sources
    • R. C. Baumann. Soft Errors in Advanced Semiconductor Devices-Part I: Three Radiation Sources. IEEE Transactions on Device and Materials Reliability, 1(1):17-22, 2001.
    • (2001) IEEE Transactions on Device and Materials Reliability , vol.1 , Issue.1 , pp. 17-22
    • Baumann, R.C.1
  • 3
    • 33748523576 scopus 로고
    • Fast Parity Checking in Cache Tag Memory. United State Patent 4483003
    • D. D. Boulder. Fast Parity Checking in Cache Tag Memory. United State Patent 4483003, 1982.
    • (1982)
    • Boulder, D.D.1
  • 5
    • 0003465202 scopus 로고    scopus 로고
    • The simplescalar toolset, version 2.0
    • University of Wisconsin-Madision
    • D. Burger and T. Austin. The SimpleScalar toolset, version 2.0. CS-TR-1997-1342, University of Wisconsin-Madision, 1997.
    • (1997) CS-TR-1997-1342
    • Burger, D.1    Austin, T.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.