Setup adjustment of multiple lots using a sequential monte carlo method

Technometrics

Volumn 48, Issue 3, 2006, Pages 373-385

  Lian, Zilong ^a   Colosimo, Bianca M ^b   Castillo, Enrique Del ^a  

^a The Pennsylvania State University   (United States)

^b POLITECNICO DI MILANO   (Italy)

Author keywords

Bayesian hierarchical models; Engineering process control; Random effects model; Short run manufacturing

Indexed keywords

BAYESIAN HIERARCHICAL MODELS; ENGINEERING PROCESS CONTROL; RANDOM-EFFECTS MODELS; SEQUENTIAL MONTE CARLO (SMC); SHORT-RUN MANUFACTURING;

COMPUTATIONAL COMPLEXITY; COMPUTER SIMULATION; COST ACCOUNTING; MARKOV PROCESSES; MATHEMATICAL MODELS; PARAMETER ESTIMATION; PROBLEM SOLVING; PROCESS CONTROL;

MONTE CARLO METHODS;

EID: 33748486454     PISSN: 00401706     EISSN: None     Source Type: Trade Journal    
DOI: 10.1198/004017006000000066     Document Type: Article

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