DC breakdown characteristics of high temperature polymer films

IEEE Transactions on Dielectrics and Electrical Insulation

Volumn 13, Issue 4, 2006, Pages 917-926

  Ui Haq, Saeed ^a   Raju, Gorur G ^b  

^a UNIVERSITY OF WATERLOO   (Canada)

^b UNIVERSITY OF WINDSOR   (Canada)

Author keywords

Breakdown strength; Dynamic testing; Electrode area; Maximum likelihood estimation; Microelectronics; Polymers; Scale parameter; Shape parameter; Static testing; Weibull distribution

Indexed keywords

DIELECTRIC MATERIALS; ELECTRIC BREAKDOWN; ELECTRIC POTENTIAL; ELECTRODES; FIBER OPTICS; HIGH TEMPERATURE EFFECTS; MAXIMUM LIKELIHOOD ESTIMATION; MICROELECTRONICS; POLYESTERS; SPACE APPLICATIONS; THICKNESS MEASUREMENT; WEIBULL DISTRIBUTION;

BREAKDOWN STRENGTH; DYNAMIC TESTING; SCALE PARAMETER; SHAPE PARAMETER; STATIC TESTING;

PLASTIC FILMS;

EID: 33748309292     PISSN: 10709878     EISSN: None     Source Type: Journal    
DOI: 10.1109/TDEI.2006.1667753     Document Type: Article

References (32)

1. J. R. Laghari and P. J. Cygan, "Accelerated Life Studies of Polyimide Film under Electrical and Thermal Multistress", IEEE-ISEI, pp. 66-69, 1992.
2. T. Shimakage, K. Wu, T. Kato, T. Oakamoto, and Y. Suzuoki, "Economic Evaluation of Cable Replacement Considering Annual Failure Probability" IEEE-ISEI, pp. 472 - 475, 2002.
3. G. G. Raju, Dielectrics in Electric Fields (Power Engineering, 19), Marcel Dekker, 2003.
4. H. L. Saums, Materials for Electrical Insulating and Dielectric Functions, Hayden Book Company, Inc. 1978.
5. K. Kato, X. Han, and H. Okubo, "Insulation Optimization by Electrode Contour Modification Based on Breakdown Area/Volume Effects", IEEE Trans. Dielectr. Electr. Insul., Vol. 8, pp. 162-167, 2001.
6. G. Raju, A. Katebian, S. Z. Jafri, "Breakdown Voltages of Polymers in the Temperature Range 23°C-250°C", IEEE Trans. Electr. Insul., Vol. 10, pp. 117-127, 2003.
7. J. J. O'Dwyer, "Breakdown in Solid Dielectrics", IEEE Trans. Electr., Insul., Vol. 17, pp. 484-487, 1982.
8. J. J. O'Dwyer, "The Role of Space Charge in the Theory of Solid-Dielectric Breakdown", IEEE Trans. Elect. Insul., Vol. 19, pp. 1-9, 1984.
9. H. Goshima, N. Hayakawa, M. Hikita, H. Okubo, and K. Uchida, "Area and Volume Effects on the Breakdown Strength in Liquid Nitrogen", IEEE Trans. Dielectr. Electr. Insul., Vol. 2, pp. 376-384, 1995.
10. H. Goshima, N. Hayakawa, M. Hikita, H. Okubo, and K. Uchida, "Weibull Statistical Analysis of Area and Volume Effects on the Breakdown Strength in Liquid Nitrogen", IEEE Trans. Dielectr. Electr. Insul., Vol. 2, pp. 385-393, 1995.
11. D. A. Seanor, Electrical Properties of Polymers, Chapter 8, Academic Press, New York, pp. 319-365, 1982.
12. T. Shioiri, T. Kamikawaji, E. Kaneko, M. Homma, H. Takahashi, and I. Ohshima, "Influence of Electrode Area on the Conditioning Effect in Vacuum", IEEE Trans. Dielectr. Electr. Insul.,Vol. 2, pp. 317-320, 1995.
13. M. Ikeda, T. Teranishi, M. Honda, and T. Yanari, "Breakdown Characteristic of Moving Transformer Oil", IEEE Trans. Power App. Syst., Vol. 100, pp. 921-928, 1981.
14. B. Helgee and P. Bjellheim, "Electric Breakdown Strength of Aromatic Polymers Dependence of Film Thickness and Chemical Structure", IEEE Trans. Electr. Insul., Vol. 26, pp. 1147-1152, 1991.
15. S. Cygan, and J. R. LaGhari, "Dependence of the Electric Strength on the Thickness, Area and Volume of Polypropylene", IEEE Trans. Electr. Insul., Vol. 22, pp. 835-837, 1987.
16. J. C. Fothergill, "Testing to Breakdown - What Does This Tell Us?" Insulation Diagnostics - Methods for Determining Quality, Remnant Life and Proof Testing, IEE Colloquium, pp. 1-2, 1991.
17. S. Ul-Haq and G. Raju, "Weibull Statistical Analysis of Area Effect on the Breakdown Strength in Polymer Films", IEEE Conf. Electr. Insul. Dielectr. Phenomena, pp. 518-521, 2002.
18. S. Ul-Haq and G. Raju, "Breakdown Pattern Identification in High Temperature Dielectric Films using Scanning Electron Microscopy (SEM)", IEEE Conf. Electr. Insul. Dielectr. Phenomena, pp. 265-268, 2003.
19. L. A. Dissado, J. C. Forthergill, S. Wolfe, "Weibull Statistics in Dielectric Breakdown; Theoretical Basis, Applications and Implications", IEEE Trans. Elect. Insul., Vol. 19, pp. 227-233, 1984.
20. C. Chauvet, and C. Laurent, "Weibull Statistics in Short-Term Dielectric Breakdown of Thin Polyethylene Films", IEEE Trans. Electr., Insul., Vol. 28, pp. 18-29, 1993.
21. T. Hakamada, "Analysis of Weibull Distribution for Electrical Breakdown Voltage of Stator Windings", IEEE Trans. Electr. Insul., Vol. 19, pp. 114-118, 1984.
22. W. Weibull, "A Statistical Distribution of Wide Applicability", J. Applied. Mech., Vol. 18, pp. 293-297, 1951.
23. G. C. Stone, M. Kurtz, R. G. Heewjik, "The Statistical Analysis of HV Endurance Test on an Epoxy", IEEE Trans. Elect. Insul., Vol. 14, pp. 315-326, 1979.
24. J. C. Forthergill, "Estimating the Cumulative Probability of Failure Data Points to be Plotted on Weibull and Other Probability Paper", IEEE Trans. Electr. Insul., Vol. 25, pp. 489-492, 1990.
25. G. C. Stone, and R. G. Van Heeswijk, "Parameter Estimation for Weibull Distribution", IEEE Trans. Electr. Insul., Vol. EI, pp. 253-261, 1997.
26. "IEEE Guide for the Statistical Analysis of Electrical Insulation Voltage Endurance Data", ANSI/IEEE Std. 930, 1987.
27. M. Nagao, G. Sawa, M. Fukui and M. Ieda, "Dielectric Breakdown of Polyimide Film in High Temperature Region", Japan, J. App. Phys., Vol. 15, pp. 1813-1814, 1976.
28. G. Raju, "Conduction and Thermally Simulated Discharge Currents in Aramid Paper", IEEE Trans. Elect. Insul., Vol. 27, pp. 162-172, 1992.
29. L. A. Dissado and J. C. Fothergill, Electrical Degradation and Breakdown in Polymers, IEE Materials and Devices Series 9, Peter Peregrinus Ltd., London, UK, 1992.
30. J. C. Fothergill, "Personal Communication", 2002.
31. Dupont film and fibers, 2004.
32. F. Guastavino, G. Coletti and E. Torello, "Medium Term Aging Characterization of Enamelled for High Frequency Applications",IEEE Trans. Dielectr. Electr. Insul., Vol. 12, pp. 524-529, 2005.