Breakdown pattern identification in high temperature dielectric films using scanning electron microscopy (SEM)

Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report

Volumn , Issue , 2003, Pages 265-268

  Ul Haq, Saeed ^a   Raju, Gorur ^a  

^a UNIVERSITY OF WINDSOR   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; DIELECTRIC FILMS; PHYSICAL VAPOR DEPOSITION; POLYETHYLENE TEREPHTHALATES; SCANNING ELECTRON MICROSCOPY; WEIBULL DISTRIBUTION;

BREAKDOWN PATTERNS;

ELECTRIC POTENTIAL;

EID: 0242507465     PISSN: 00849162     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)

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