Weibull statistical analysis of area effect on the breakdown strength in polymer films

Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report

Volumn , Issue , 2002, Pages 518-521

  Ul Haq, Saeed ^a   Govinda Raju, G R ^a  

^a UNIVERSITY OF WINDSOR   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC BREAKDOWN; ELECTRODES; PLASTIC FILMS; PROBABILITY; THERMAL EFFECTS; THICKNESS MEASUREMENT; WEIBULL DISTRIBUTION;

BREAKDOWN STRENGTH;

ELECTRIC TRANSFORMERS;

EID: 0036442716     PISSN: 00849162     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)

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