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Volumn 89, Issue 9, 2006, Pages

Point contact Andreev reflection by nanoindentation of polymethyl methacrylate

(2)  Clifford, E a   Coey, J M D a  

a NONE

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COPPER; NANOTECHNOLOGY; NICKEL; POINT CONTACTS; SUPERCONDUCTING MATERIALS; THIN FILMS;

EID: 33748278710     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2345361     Document Type: Article
Times cited : (7)

References (19)
  • 3
    • 0000433883 scopus 로고
    • [Sov. Phys. JETP 19, 1228 (1964)].
    • (1964) Sov. Phys. JETP , vol.19 , pp. 1228


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.