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Physical Review Letters

Volumn 86, Issue 24, 2001, Pages 5585-5588

Determination of the spin polarization of half-metallic CrO2 by point contact Andreev reflection

(8) Ji, Y a Strijkers, G J a Yang, F Y a Chien, C L a Byers, J M b Anguelouch, A c Xiao, Gang c Gupta, A d

a JOHNS HOPKINS UNIVERSITY (United States)

b NAVAL RESEARCH LABORATORY (United States)

c BROWN UNIVERSITY (United States)

d IBM T J WATSON RESEARCH CENTER (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; ELECTRIC CONDUCTANCE; ELECTRIC POTENTIAL; FERROMAGNETIC MATERIALS; FILM GROWTH; INTERFACES (MATERIALS); LEAD; MATHEMATICAL MODELS; POLARIZATION; REFLECTION; SINGLE CRYSTALS; TRANSPORT PROPERTIES;

ANDREEV REFLECTION; BLONDER-TINKHAM-KLAPWIJK MODEL; CHROMIUM OXIDE; CONDUCTANCE VOLTAGE CURVE; HALF METALLIC FERROMAGNETS; POINT CONTACT; SPIN POLARIZATION;

CHROMIUM COMPOUNDS;

EID: 0035844668 PISSN: 00319007 EISSN: None Source Type: Journal
DOI: 10.1103/PhysRevLett.86.5585 Document Type: Article

Times cited : (481)

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