Nonlinear electrical properties of three-terminal junctions

Applied Physics Letters

Volumn 89, Issue 9, 2006, Pages

  Wallin, D ^a   Shorubalko, I ^a,c   Xu, H Q ^a   Cappy, A ^b  

^a LUND UNIVERSITY   (Sweden)

^b INSTITUT D ELECTRONIQUE   (France)

^c UNIVERSITY OF LATVIA   (Latvia)

Author keywords

[No Author keywords available]

Indexed keywords

CORRELATION METHODS; ELECTRICAL ENGINEERING; ELECTRON TRANSPORT PROPERTIES; ELECTRONS;

ELECTRICAL MEASUREMENTS; ELECTRON MEAN FREE PATH; JUNCTION SIZE; THREE-TERMINAL JUNCTIONS;

SEMICONDUCTOR JUNCTIONS;

EID: 33748255715     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2344849     Document Type: Article

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