Transmission electron microscopy study of as-grown MgB2 films

Physica C: Superconductivity and its Applications

Volumn 445-448, Issue 1-2, 2006, Pages 887-890

  Takahashi, T ^a   Harada, Y ^b   Iriuda, H ^a   Kuroha, M ^a   Oba, T ^a   Seki, M ^a   Nakanishi, Y ^a   Echigoya, J ^a   Yoshizawa, M ^a  

^a IWATE UNIVERSITY   (Japan)

^b Iwate Industrial Promotion Center   (Japan)

Author keywords

MBE; MgB2; Superconducting film; TEM; ZnO

Indexed keywords

HIGH ENERGY ELECTRON DIFFRACTION; MAGNESIUM COMPOUNDS; MOLECULAR BEAM EPITAXY; SUPERCONDUCTING DEVICES; SUPERCONDUCTING FILMS; SUPERCONDUCTING TRANSITION TEMPERATURE; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS; ZINC OXIDE;

FILMS DEPOSITION; HIGH TRANSITION TEMPERATURE; STRUCTURAL PROPERTIES; SUPERCONDUCTING ELECTRONIC DEVICES;

THIN FILMS;

EID: 33748171068     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physc.2006.05.065     Document Type: Article

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