Load and boundary condition calibration using full-field strain measurement

Experimental Mechanics

Volumn 46, Issue 5, 2006, Pages 569-578

  Padmanabhan, S ^a   Hubner, J P ^b   Kumar, A V ^a   Ifju, P G ^a  

^a UNIVERSITY OF FLORIDA   (United States)

^b Box 870280   (United States)

Author keywords

Inverse problem; Load calibration; Photoelasticity

Indexed keywords

BOUNDARY CONDITIONS; FINITE ELEMENT METHOD; INVERSE PROBLEMS; MATHEMATICAL MODELS; OPTIMIZATION; PHOTOELASTICITY; STRAIN MEASUREMENT; STRUCTURAL LOADS;

LOAD BEARING STRUCTURES; LOAD CALIBRATION;

BEARINGS (STRUCTURAL);

BEARINGS (STRUCTURAL); BOUNDARY CONDITIONS; FINITE ELEMENT METHOD; INVERSE PROBLEMS; MATHEMATICAL MODELS; OPTIMIZATION; PHOTOELASTICITY; STRAIN MEASUREMENT; STRUCTURAL LOADS;

EID: 33748101245     PISSN: 00144851     EISSN: 17412765     Source Type: Journal    
DOI: 10.1007/s11340-006-8708-2     Document Type: Article

References (21)

1. Fu G, Moosa AG (2002) An optical approach to structural displacement measurement and its application. J Eng Mech 128(5):511-520.
2. Chock JMK, Kapania RK (2003) Load updating for finite element models. AIAA J 41(9):1667-1673.
3. Reich GW, Park KC (2001) A theory for strain based structural system identification. J Appl Mech, ASME 68(7):521-527.
4. Sanayei M, Saletnik MJ (1996) Parameter estimation of structures from static strain measurements. I. Formulation. J Struct Eng, ASCE 122(5):555-562.
5. Shkarayev S, Krashantisa R, Tessler A (2001) An inverse interpolation method utilizing in-flight strain measurements for determining loads and structural response of aerospace vehicles" 3rd International Workshop on Structural Health Monitoring, September 12-14, Stanford, California.
6. Liu T, Barrows DA, Burner AW, Rhew RD (2001) Determining aerodynamic loads based on optical deformation measurements. AIAA J 40(6):1105-1112.
7. Cao X, Sugiyama Y, Mitsui Y (1998) Application of artificial neural networks to load identification. Comput Struct 69:63-78.
8. Cardenas-Garcia JF, Ekwaro-Osire S, Berg JM (2001) Solution to the Moiré hole method problem. Mech Res Commun 28(1):13-32.
9. Cardenas-Garcia JF (2000) Determination of the elastic constants using Moiré. Mech Res Commun 27(1):69-77.
10. Wang Z, Cardenas-Garcia JF, Han B (2005) Inverse method to determine elastic constants using a circular disc and Moiré interferometry. Exp Mech 45(1):27-34.
11. Cardenas-Garcia JF, Shabana YM (2005) An inverse problem finite-element-method-based approach to the hole drilling method in photoelasticity. Proceedings of the 2005 SEM Conference and Exhibition on Experimental and Applied Mechanics, Paper No. 33.
12. Cardenas-Garcia JF, Ekwaro-Osire S, Berg JM, Wilson WH (2005) Non-linear least-squares solution to the Moiré hole method problem in orthotropic materials. Part I. Residual stresses. Exp Mech 45(4):301-313.
13. Cardenas-Garcia JF, Ekwaro-Osire S, Berg JM, Wilson WH (2005) Non-linear Least-squares solution to the Moiré hole method problem in orthotropic materials. Part II. Material elastic constants. Exp Mech 45(4):314-324.
14. Cho S, Cardenas-Garcia JF, Chasiotis I (2005) Measurement of nanodisplacements and elastic properties of MEMS via the microscopic hole method. Sens Actuators A 120:163-171.
15. Avril S, Grediac M, Pierron F (2004) Sensitivity of the virtual fields method to noisy data. Comput Mech 34:439-452.
16. Grediac M (2004) The use of full-field measurement methods in composite material characterization: Interest and limitations. Compos: Part A 35:751-761.
17. Grediac M, Pierron F (2004) Numerical issues in the virtual fields method. Int J Numer Methods Eng 59:1287-1312.
18. Bonnet M, Constantinescu A (2005) Inverse problems in elasticity. Inverse Probl 21:R1-R51.
19. Hubner JP, Ifju PG, Schanze KS, Liu Y, Chen L, El-Ratal W (2004) Luminescent photoelastic coatings. Exp Mech 44(4):416-424.
20. Hubner J, Chen L, Liu Y, Schanze K, Nicolosi J, Ifju P, El-Ratal W (2005) Characterization of a new luminescent photoelastic coating. Exp Mech 45(2):137-143.
21. Bertsekas DP (1999) Nonlinear Programming, Second Edition. Athena Scientific.