Structural and microstructural properties of porous PZT films

Journal of Optoelectronics and Advanced Materials

Volumn 8, Issue 4, 2006, Pages 1492-1497

  Stancu, V ^a   Boerasu, I ^c   Lisca, M ^a   Pintilie, L ^b   Popescu, M ^a   Sava, F ^a  

^a NATIONAL INSTITUTE OF MATERIALS PHYSICS   (Romania)

^b MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

^c JO EF STEFAN INSTITUTE   (Slovenia)

Author keywords

Hydrolysis; Polyvinylpirrolidone (PVP); Porous PZT fims

Indexed keywords

ATOMIC FORCE MICROSCOPY; CAPACITANCE; HYDROLYSIS; LEAD COMPOUNDS; SCANNING ELECTRON MICROSCOPY; SOLS; THIN FILMS; TITANIUM COMPOUNDS; ZIRCONIUM COMPOUNDS;

CAPACITANCE VOLTAGE CHARACTERISTIC; FERROELECTRIC BEHAVIOR; HYSTERESIS LOOP MEASUREMENTS; MICRO-STRUCTURAL PROPERTIES; POLYVINYLPIRROLIDONE (PVP); POROUS PZT; REMNANT POLARIZATIONS; SURFACE MICROSTRUCTURES;

FILM PREPARATION;

EID: 33748057799     PISSN: 14544164     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (24)

1. M. Kohli, C. Wuethrich, K. Brooks, B. Willing, M. Forser, M. Murait, N. Setter, P. Ryser, Sensor and Actuator A 60, 147 (1997).
2. R. W. Whatmore, Rep. Prog. Phys. 49, 1335 (1986).
3. W. Braun, B. S. Kwak, A. Erbil, J. D. Budai, B. J. Wilkens, Appl. Phys. Lett 63, 467 (1993).
4. K. Iijima, Y. Tomita, R. Takayama, l. Ueda, J. Appl. Phys 60, 361 (1986).
5. R. N. Castellano, L. G. Feinstein, J. Appl. Phys 50, 4406 (1979).
6. K. D. Budd, S. K. Dey, D. A. Payne, Brit. Ceram. Proc. 36, 107 (1985).
7. G. Yi, Z. Wu, M. Sayer, J. Appl. Phys 64, 2717 (1988).
8. C. D. E. Lakerman, D. A. Payne, J. AM. Ceram. Soc. 75, 3091 (1992).
9. L. E. Sanchez, D. T. Dion, S. Y. Wu, I. K. Naik, Ferroelectrics 116, 1-17 (1991).
10. S. J. Milne, S. H. Pyke, J. Am. Cerem. Soc 74, 1407 (1991).
11. S. J. Chen, A. Janah, J. D. Mackenzie, in Better Ceramics through Chemistry II, edited by C. J. Brinker, D. E. Clark and D. R. Ulrich (Mater. Res. Symp. Proc 73, Pittsburg, PA, 1986), P.731.
12. N. Tohge, S. Takahashi, T. Minami, J. Am. Ceram. Soc 74, 67 (1991).
13. G. Suyal, N. Setter, J. Eur. Ceram. Soc 24, 247 (2004).
14. A. Seifert, L. Sagalowicz, P. Muralt, N. Setter, J. Mat. Res. 14, 2012 (1999).
15. C. D. E. Lakerman, J. F Campion, D. A. Payne, CERAM> Trans. 25, 413 (1992).
16. V. Kumar, Y. Ohya, Y. Takahashi, Jpn. J. Appl. Phys. 37, 4477 (1998).
17. Z. Huang, Q. Zhang, R. W. Whatmore, J. Appl. Phys 86, 1662 (1999).
18. Z. Wang, J. Liu, T. Ren, L. Liu, Sensor and Actuators A 117, 293 (2005).
19. K. G. Brooks, I. M. Reaney, R. Klissurska, Y. Huang, L. Bursill, N. Setter, J. Mater. Res. 9, 2540 (1994).
20. M. Klee, R. Eusemann, R. Waser, W. Brand, H. van Hal, J. Appl. Phys. 72, 1566 (1992).
21. C. J. Brinker, G. W. Scherer, Sol-gel science, Academic Press, San Diego (1990).
22. A. Seifert, P. Muralt, N. Setter, J. Appl. Phys. 72, 2409 (1998).
23. Q. Zhang, S. Corkovic, C. P. Shaw, Z. Huang, R. W. Whatmore, Thin Solid Film 488, 258 (2005).
24. H. Kozuka, M. Kajimura, J. Am. Ceram. Soc. 83, 1056 (2000).