Measurement of electrical conductivity of Zn50Se50 alloy at different temperatures

Journal of Optoelectronics and Advanced Materials

Volumn 8, Issue 4, 2006, Pages 1641-1642

  Kishore, V ^a   Saxena, N S ^a   Saraswat, Vibhav K ^a   Sharma, Kanan Bala ^a   Sharma, T P ^a  

^a UNIVERSITY OF RAJASTHAN   (India)

Author keywords

Electrical conductivity; Polycrystalline; X ray diffraction

Indexed keywords

CRYSTAL STRUCTURE; ELECTRIC CONDUCTIVITY; X RAY DIFFRACTION;

ELECTRICAL CONDUCTIVITY; FIXED TEMPERATURE; MELT COOLING; POLYCRYSTALLINE; X-RAY DIFFRACTION METHOD;

ZINC ALLOYS;

EID: 33748039436     PISSN: 14544164     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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