Reduction of structural defects in II-VI blue green laser diodes

Applied Physics Letters

Volumn 69, Issue 5, 1996, Pages 602-604

  Chu, C C ^a   Ng, T B ^a   Han, J ^a   Hua, G C ^a   Gunshor, R L ^a   Ho, E ^b   Warlick, E L ^b   Kolodziejski, L A ^b   Nurmikko, A V ^c  

^a PURDUE UNIVERSITY   (United States)

^b USA   (United States)

^c Brown University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CATHODOLUMINESCENCE; CRYSTAL DEFECTS; MOLECULAR BEAM EPITAXY; MONOCHROMATORS; NUCLEATION; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING ZINC COMPOUNDS; STACKING FAULTS; SURFACES; TRANSMISSION ELECTRON MICROSCOPY;

BLUE GREEN LASERS; LATTICE MATCHING; SEPARATE CONFINEMENT HETEROSTRUCTURES; WAFER CLEAVING; ZINC SELENIDE;

SEMICONDUCTOR LASERS;

EID: 0030194522     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.117920     Document Type: Article

References (19)

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17. "Alternative layer epitaxy" might be a more appropriate nomenclature than "MEE" (see Ref. 9). Since the kinetic behavior of Zn and Se atoms is not really established, conceivably one could argue that the migration of Zn (Se) on a Se (Zn) terminated surface is actually reduced due to the abundance of bonding sites.
18. Determining an exact correlation between island nucleation and defect generation demands further investigation. Speculative models under consideration include the initial coalescence of 3-D islands [see J. M. Gaines, J. Petruzello, and B. Greenberg, J. Appl. Phys. 73, 2835 (1993)] and the occurrence of stacking errors along the faceted islands [see F. Ernst and P. Pirouz, J. Mater. Res. 4, 834 (1989)].
19. Determining an exact correlation between island nucleation and defect generation demands further investigation. Speculative models under consideration include the initial coalescence of 3-D islands [see J. M. Gaines, J. Petruzello, and B. Greenberg, J. Appl. Phys. 73, 2835 (1993)] and the occurrence of stacking errors along the faceted islands [see F. Ernst and P. Pirouz, J. Mater. Res. 4, 834 (1989)].