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Volumn , Issue , 2005, Pages 105-108

Phase noise degradation of LC-tank VCOs due to substrate noise and package coupling

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITORS; CIRCUIT OSCILLATIONS; ELECTRIC INDUCTORS; NATURAL FREQUENCIES; PHASE MEASUREMENT; SPURIOUS SIGNAL NOISE;

EID: 33747861016     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ESSCIR.2005.1541569     Document Type: Conference Paper
Times cited : (20)

References (12)
  • 1
    • 0035274550 scopus 로고    scopus 로고
    • Measuring and modeling the effects of substrate noise on the LNA for CMOS GPS receiver
    • M. Xu, D.K. Su, D.K Shaeffer, T.H. Lee, B.A. Wooley, "Measuring and Modeling the Effects of Substrate Noise on the LNA for CMOS GPS Receiver," IEEE J. of Solid-State Circuits, Vol. 36, No. 3, pp. 473-485, 2001.
    • (2001) IEEE J. of Solid-state Circuits , vol.36 , Issue.3 , pp. 473-485
    • Xu, M.1    Su, D.K.2    Shaeffer, D.K.3    Lee, T.H.4    Wooley, B.A.5
  • 2
    • 17644418581 scopus 로고    scopus 로고
    • RF performance degradation due to coupling of digital switching noise in lightly doped substrates
    • C. Soens et al, "RF performance degradation due to coupling of digital switching noise in lightly doped substrates," in Southwest Symp. on Mixed-Signal Design, 2003, pp. 505-508.
    • (2003) Southwest Symp. on Mixed-signal Design , pp. 505-508
    • Soens, C.1
  • 4
    • 33749161634 scopus 로고    scopus 로고
    • http://www.cadence.com/products/substrate_noise_analysis.html.
  • 5
    • 0000198177 scopus 로고    scopus 로고
    • Integration and electrical isolation in CMOS mixed-signal wireless chips
    • R.C. Frye, "Integration and electrical isolation in CMOS mixed-signal wireless chips," Proceedings of the IEEE, Vol. 89, No. 4, pp. 444-454, 2001.
    • (2001) Proceedings of the IEEE , vol.89 , Issue.4 , pp. 444-454
    • Frye, R.C.1
  • 6
    • 0033332172 scopus 로고    scopus 로고
    • Modeling and simulation of the interferencedue to digital switching in mixed-mode ICs
    • A. Demir, P. Feldmann, "Modeling and simulation of the interferencedue to digital switching in mixed-mode ICs," in IEEE/ACM Intl. Conf. on CAD, 1999, pp. 70-74.
    • (1999) IEEE/ACM Intl. Conf. on CAD , pp. 70-74
    • Demir, A.1    Feldmann, P.2
  • 8
    • 3042742319 scopus 로고    scopus 로고
    • Digital circuit capacitance and switching analysis for ground bounce in ICs with a high-ohmic substrate
    • M. Badaroglu et al, "Digital circuit capacitance and switching analysis for ground bounce in ICs with a high-ohmic substrate," IEEE J. of Solid-State Circuits, Vol. 39, No. 7, pp. 1119-1130, 2004.
    • (2004) IEEE J. of Solid-state Circuits , vol.39 , Issue.7 , pp. 1119-1130
    • Badaroglu, M.1
  • 10
  • 11
    • 0036684720 scopus 로고    scopus 로고
    • Frequency dependence on bias current in 5-GHz CMOS VCOs: Impact on tuning range and flicker noise upconversion
    • S. Levantine, et al, "Frequency Dependence on Bias Current in 5-GHz CMOS VCOs: Impact on Tuning Range and Flicker Noise Upconversion," IEEE J. of Solid-State Circuits, Vol. 37, No. 8, pp. 1003-1011, 2002.
    • (2002) IEEE J. of Solid-state Circuits , vol.37 , Issue.8 , pp. 1003-1011
    • Levantine, S.1
  • 12
    • 13444274744 scopus 로고    scopus 로고
    • The impact of device type and sizing on phase noise mechanism
    • A. Jerng, C.G. Sodini, "The impact of device type and sizing on phase noise mechanism," IEEE J. of Solid-State Circuits, Vol. 40, No. 2, pp. 360-369, 2005.
    • (2005) IEEE J. of Solid-state Circuits , vol.40 , Issue.2 , pp. 360-369
    • Jerng, A.1    Sodini, C.G.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.