Localized surface plasmon resonance spectroscopy near molecular resonances

Journal of the American Chemical Society

Volumn 128, Issue 33, 2006, Pages 10905-10914

  Haes, Amanda J ^a,b   Zou, Shengli ^a   Zhao, Jing ^a   Schatz, George C ^a   Van Duyne, Richard P ^a  

^a NORTHWESTERN UNIVERSITY   (United States)

^b UNIVERSITY OF IOWA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; MOLECULAR DYNAMICS; NANOSTRUCTURED MATERIALS; PRECIOUS METALS; REFRACTIVE INDEX;

MOLECULAR RESONANCES; NANOPARTICLE RESONANCES; WAVELENGTH DEPENDENCE;

SURFACE PLASMON RESONANCE;

METAL; NANOPARTICLE;

ABSORPTION SPECTROSCOPY; ARTICLE; OSCILLATION; QUANTITATIVE ANALYSIS; SPECTROSCOPY; SURFACE PLASMON RESONANCE;

EID: 33747784284     PISSN: 00027863     EISSN: None     Source Type: Journal    
DOI: 10.1021/ja063575q     Document Type: Article

References (49)

1. Schatz, G. C.; Van Duyne, R. P. Electromagnetic Mechanism of Surface-Enhanced Spectroscopy; Wiley: New York, 2002; Vol. 1.
2. Andersen, P. C.; Jacobson, M. L.; Rowlen, K. L. J. Phys. Chem. B 2004, 108, 2148-2153.
3. Geddes, C. D.; Parfenov, A.; Roll, D.; Fang, J.; Lakowicz, J. R. Langmuir 2003, 19, 6236-6241.
4. Etchegoin, P.; Cohen, L. F.; Hartigan, H.; Brown, R. J. C.; Milton, M. J. T.; Gallop, J. C. Chem. Phys. Lett. 2004, 383, 577-583.
5. Haynes, C. L.; Van Duyne, R. P. J. Phys. Chem. B 2003, 107, 7426-7433.
6. Jeanmaire, D. L.; Van Duyne, R. P. J. Electroanal. Chem. Interfacial Electrochem. 1977, 84, 1-20.
7. Nie, S.; Emory, S. R. Science 1997, 275, 1102-1106.
8. Kneipp, K.; Wang, Y.; Kneipp, H.; Perelman, L. T.; Itzkan, I.; Dasari, R. R.; Feld, M. S. Phys. Rev. Lett. 1997, 78, 1667-1670.
9. Malinsky, M. D.; Kelly, K. L.; Schatz, G. C.; Van Duyne, R. P. J. Am. Chem. Soc. 2001, 123, 1471-1482.
10. Haes, A. J.; Zou, S.; Schatz, G. C.; Van Duyne, R. P. J. Phys. Chem. B 2004, 108, 109-116.
11. Haes, A. J.; Zou, S.; Schatz, G. C.; Van Duyne, R. P. J. Phys. Chem. B 2004, 108, 6961-6968.
12. Haes, A. J.; Van Duyne, R. P. J. Am. Chem. Soc. 2002, 124, 10596-10604.
13. Riboh, J. C.; Haes, A. J.; McFarland, A. D.; Yonzon, C. R.; Van Duyne, R. P. J. Phys. Chem. B 2003, 107, 1772-1780.
14. McFarland, A. D.; Van Duyne, R. P. Nano Lett. 2003, 3, 1057-1062.
15. Nath, N.; Chilkoti, A. Proc. SPIE 2002, 4626, 441-448.
16. Nath, N.; Chilkoti, A. Anal. Chem. 2002, 74, 504-509.
17. Jensen, T. R.; Malinsky, M. D.; Haynes, C. L.; Van Duyne, R. P. J. Phys. Chem. B 2000, 104, 10549-10556.
18. Haes, A. J.; Van Duyne, R. P. Mater. Res. Soc. Symp. Proc. 2002, 723, O3.1.1-O3.1.6.
19. Hulteen, J. C.; Van Duyne, R. P. J. Vac. Sci. Technol. A 1995, 13, 1553-1558.
20. Haynes, C. L.; Van Duyne, R. P. J. Phys. Chem. B 2001, 105, 5599-5611.
21. Gersten, J.; Nitzan, A. J. Chem. Phys. 1980, 73, 3023-3037.
22. Kurihara, K.; Nakamura, K.; Hirayama, E.; Suzuki, K. Anal. Chem. 2002, 74, 6323-6333.
23. Kurihara, K.; Suzuki, K. Anal. Chem. 2002, 74, 696-701.
24. Wang, S.; Boussaad, S.; Tao, N. J. Suifact. Sci. Ser. 2003, 111, 213-251.
25. Wang, S.; Boussaad, S.; Wong, S.; Tao, N. J. Anal. Chem. 2000, 72, 4003-4008.
26. Boussaad, S.; Pean, J.; Tao, N. J. Anal. Chem. 2000, 72, 222-226.
27. Zangeneh, M.; Doan, N.; Sambriski, E.; Terrill, R. H. Appl. Spectrosc. 2004, 58, 10-17.
28. Pockrand, I.; Brillante, A.; Mobius, D. J. Chem. Phys. 1982, 77, 6289-6295.
29. Pockrand, I.; Swalen, J. D.; Gordon, J. G.; Philpott, M. R. J. Chem. Phys. 1979, 70, 3401-3408.
30. Fussa-Rydel, O.; Zhang, H. T.; Hupp, J. T.; Leidner, C. R. Inorg. Chem. 1989, 28, 1533-1537.
31. Montalban, A. G.; Lange, S. J.; Beall, L. S.; Mani, N. S.; Williams, D. J.; White, A. J. P.; Barrett, A. G. M.; Hoffman, B. M. J. Org. Chem. 1997, 62, 9284-9289.
32. Velazquez, C. S.; Fox, G. A.; Broderick, W. E.; Andersen, K. A.; Anderson, O. P.; Barrett, A. G. M.; Hoffman, B. M. J. Am. Chem. Soc. 1992, 114, 7416-7424.
33. Gouterman, M. Porphyrins 1978, 3, 1-165.
34. Linstead, R. P.; Whalley, M. J. Chem. Soc. 1952, 4839-4846.
35. Jung, L. S.; Campbell, C. T.; Chinowsky, T. M.; Mar, M. N.; Yee, S. S. Langmuir 1998, 14, 5636-5648.
36. Kronig, R. d. L.; Kramers, H. A. Z. Phys. 1928, 48, 174-179.
37. Schanze, K. S.; Bergstedt, T. S.; Hauser, B. T.; Cavalaheiro, C. S. P. Langmuir 2000, 16, 795-810.
38. Aizenberg, J.; Rogers, J. A.; Paul, K. E.; Whitesides, G. M. Appl. Opt. 1998, 37, 2145-2152.
39. Draine, B. T.; Flatau, P. J. J. Opt. Soc. Am. A 1994, 11, 1491-1499.
40. Kelly, K. L.; Coronado, E.; Zhao, L.; Schatz, G. C. J. Phys. Chem. B 2003, 107, 668-677.
41. Lynch, D. W.; Hunter, W. R. In Handbook of Optical Constants of Solids; Palik, E. D., Ed.; Academic Press: New York, 1985; pp 350-356.
42. Jensen, T. R.; Kelly, K. L.; Lazarides, A.; Schatz, G. C. J. Cluster Sci. 1999, 10, 295-317.
43. Jensen, T. R.; Schatz, G. C.; Van Duyne, R. P. J. Phys. Chem. B 1999, 103, 2394-2401.
44. Born, M.; Wolf, E. Principles of Optics: Electromagnetic Theory of Propagation, Interference and Diffraction of Light, 6th ed.; Pergamon Press Inc.: Elmsford, NY, 1980.
45. Wiederrecht, G. P.; Wurtz, G. A.; Hranisavljevic, J. Nano Lett. 2004, 4, 2121-2125.
46. Dick, S. Z. Kristallogr., New Crys. Struct. 1998, 213, 356.
47. Felix, F.; Ferguson, J.; Guedel, H. U.; Ludi, A. Chem. Phys. Lett. 1979, 62, 153-157.
48. Decurtins, S.; Felix, F.; Ferguson, J.; Guedel, H. U.; Ludi, A. J. Am. Chem. Soc. 1980, 102, 4102-4106.
49. Hanazaki, I.; Nagakura, S. 1969, 8, 648-653.