S.E.U. Testing of 32-BIT microprocessors

IEEE Radiation Effects Data Workshop

Volumn , Issue , 1992, Pages 16-20

  Velazco, R ^a   Karoui, S ^a   Chapuis, T ^b  

^a UNIV GRENOBLE ALPES   (France)

^b Centre National des Etudes Spaciales ^*  (France)

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL ARITHMETIC; HEAVY IONS;

32-BIT PROCESSORS; FLOATING POINTS; MEMORY ELEMENT; MICROPROCESSOR SENSITIVITY; TEST PROGRAM;

RADIATION EFFECTS;

EID: 85064640607     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/REDW.1992.247330     Document Type: Conference Paper

References (10)

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